Charge-Transfer Insulators

Abstract

Resistivities of thin-film Cs-based alloys prepared by coevaporation at He temperature reveal charge transfer to high-valence impurities. Percolative transitions to new disordered insulating phases occur as the impurity content is increased. Metallic components of resistance exceeding 3×104Ω are observed near the percolation thresholds.

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http://journals.aps.org.sci-hub.cc/prl/abstract/10.1103/PhysRevLett.41.428