James M. Rondinelli,1 Nuala M. Caffrey,2 Stefano Sanvito,2 and Nicola A. Spaldin1, ∗
1Materials Department, University of California, Santa Barbara, CA, 93106-5050, USA
2School of Physics and CRANN, Trinity College, Dublin 2, Ireland
(Dated: June 8, 2008)
Abstract
We calculate the properties of the 4d ferromagnet SrRuO3 in bulk and thin film form with the aim
of understanding the experimentally observed metal to insulator transition at reduced thickness. Although the spatial extent of the 4d orbitals is quite large, many experimental results have suggested
that electron-electron correlations play an important role in determining this material’s electronic
structure. In order to investigate the importance of correlation, we use two approaches which go beyond the conventional local density approximation to density functional theory (DFT): the local spin
density approximation + Hubbard U (LSDA+U) and the pseudopotential self-interaction correction
(pseudo-SIC) methods. We find that the details of the electronic structure predicted with the LSDA
do not agree with the experimental spectroscopic data for bulk and thin film SrRuO3. Improvement is found by including electron-electron correlations, and we suggest that bulk orthorhombic
SrRuO3 is a weakly strongly-correlated ferromagnet whose electronic structure is best described by a
0.6 eV on-site Hubbard term, or equivalently with corrections for the self-interaction error. We also
perform ab initio transport calculations that confirm that SrRuO3 has a negative spin polarization
at the Fermi level, due to the position of the minority Ru 4d band center. Even with correlations
included in our calculations we are unable to reproduce the experimentally observed metal-insulator
transition, suggesting that the electronic behavior of SrRuO3 ultra-thin films might be dominated
by extrinsic factors such as surface disorder and defects.
https://www.researchgate.net/publication/2208514_Electronic_properties_of_bulk_and_thin_film_SrRuO3_Search_for_the_metal-insulator_transition
0 Comments